Texas Instruments - SN74BCT8373ADWR

KEY Part #: K1320757

[2009pcs Stock]


    Part Number:
    SN74BCT8373ADWR
    Manufacturer:
    Texas Instruments
    Detailed description:
    IC SCAN TEST DEVICE LATCH 24SOIC.
    Manufacturer's standard lead time:
    In stock
    Shelf life:
    One Year
    Chip From:
    Hong Kong
    RoHS:
    Payment method:
    Shipment way:
    Family Categories:
    KEY Components Co.,LTD is a Electronic Components Distributor who offers product categories including : Interface - Drivers, Receivers, Transceivers, Memory - Batteries, Memory - Controllers, Interface - Serializers, Deserializers, Interface - I/O Expanders, Linear - Comparators, Embedded - FPGAs (Field Programmable Gate Array) with Microcontrollers and PMIC - Voltage Regulators - Linear ...
    Competitive Advantage:
    We specialize in Texas Instruments SN74BCT8373ADWR electronic components. SN74BCT8373ADWR can be shipped within 24 hours after order. If you have any demands for SN74BCT8373ADWR, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8373ADWR Product Attributes

    Part Number : SN74BCT8373ADWR
    Manufacturer : Texas Instruments
    Description : IC SCAN TEST DEVICE LATCH 24SOIC
    Series : 74BCT
    Part Status : Obsolete
    Logic Type : Scan Test Device with D-Type Latches
    Supply Voltage : 4.5V ~ 5.5V
    Number of Bits : 8
    Operating Temperature : 0°C ~ 70°C
    Mounting Type : Surface Mount
    Package / Case : 24-SOIC (0.295", 7.50mm Width)
    Supplier Device Package : 24-SOIC