Part Number :
SN74BCT8374ANTG4
Manufacturer :
Texas Instruments
Description :
IC SCAN TEST DEVICE W/FF 24-DIP
Logic Type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage :
4.5V ~ 5.5V
Operating Temperature :
0°C ~ 70°C
Mounting Type :
Through Hole
Package / Case :
24-DIP (0.300", 7.62mm)
Supplier Device Package :
24-PDIP