Part Number :
SN74BCT8374ADWRE4
Manufacturer :
Texas Instruments
Description :
IC SCAN TEST DEVICE W/FF 24-SOIC
Logic Type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage :
4.5V ~ 5.5V
Operating Temperature :
0°C ~ 70°C
Mounting Type :
Surface Mount
Package / Case :
24-SOIC (0.295", 7.50mm Width)
Supplier Device Package :
24-SOIC