Texas Instruments - SN74BCT8240ANTG4

KEY Part #: K1320213

[6439pcs Stock]


    Part Number:
    SN74BCT8240ANTG4
    Manufacturer:
    Texas Instruments
    Detailed description:
    IC SCAN TEST DEVICE BUFF 24-DIP.
    Manufacturer's standard lead time:
    In stock
    Shelf life:
    One Year
    Chip From:
    Hong Kong
    RoHS:
    Payment method:
    Shipment way:
    Family Categories:
    KEY Components Co.,LTD is a Electronic Components Distributor who offers product categories including : Embedded - Microcontrollers - Application Specific, Interface - Encoders, Decoders, Converters, Embedded - System On Chip (SoC), PMIC - Current Regulation/Management, PMIC - RMS to DC Converters, PMIC - Voltage Regulators - Linear, Interface - Sensor, Capacitive Touch and Logic - FIFOs Memory ...
    Competitive Advantage:
    We specialize in Texas Instruments SN74BCT8240ANTG4 electronic components. SN74BCT8240ANTG4 can be shipped within 24 hours after order. If you have any demands for SN74BCT8240ANTG4, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8240ANTG4 Product Attributes

    Part Number : SN74BCT8240ANTG4
    Manufacturer : Texas Instruments
    Description : IC SCAN TEST DEVICE BUFF 24-DIP
    Series : 74BCT
    Part Status : Obsolete
    Logic Type : Scan Test Device with Inverting Buffers
    Supply Voltage : 4.5V ~ 5.5V
    Number of Bits : 8
    Operating Temperature : 0°C ~ 70°C
    Mounting Type : Through Hole
    Package / Case : 24-DIP (0.300", 7.62mm)
    Supplier Device Package : 24-PDIP